Automatic Test Generation on a (U)SIM Smart Card
نویسندگان
چکیده
Usually, testing smart card software is carried-out by specialized engineers in a proprietary language. Testing represents generally half of smart card development effort. With the increasing use of semi-formal and formal modeling languages, such as UML, and the emergence of automatic test generators in the industry, we have studied a way to adapt these techniques for smart card. In this article, we present an automatic test generator, named AGATHA, and its architecture, which can handle UML specifications. Then, we suggest a way to model (U)SIM smart card functionalities in UML. We use the test generator on our (U)SIM smart card UML models and automatically produce our first test cases.
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